理数情報教育系

川越 毅

カワゴエ タケシ  (Takeshi Kawagoe)

基本情報

所属
大阪教育大学 教育学部教育協働学科 理数情報講座 教授
学位
工学修士(早稲田大学)
博士(理学)(早稲田大学)

連絡先
tkawagoecc.osaka-kyoiku.ac.jp
研究者番号
20346224
ORCID ID
 https://orcid.org/0000-0002-7600-4767
J-GLOBAL ID
200901008586193243
researchmap会員ID
5000026349

論文

 55
  • Takeshi Kawagoe
    Japanese Journal of Applied Physics 63(3) 03SP58/1-7 2024年2月29日  査読有り筆頭著者責任著者
    Abstract We investigate the growth of ultrathin Cr films on a Au(001) surface and observe that the growth of 1.5 nm thick Cr layers at 290 K, followed by post-annealing at 520 K, results in high-quality epitaxial Cr(001) films with atomically flat large terraces and distinct surface states. Subsequently, these optimized growth conditions are successfully applied to the growth of 1 nm and 3 nm thick Cr films. Magnetic imaging of 1 and 1.5 nm thick Cr(001) films prepared under the optimized growth conditions is performed using spin-polarized scanning tunneling microscopy. Distinct magnetic contrasts featuring a topological antiferromagnetic (TAF) order are observed in both films; however, spin frustration originating from the density of screw dislocations for both films shows a significant difference. The 1.0 nm thick Cr film, which exhibits a clear TAF order with the suppression of a large spin-frustrated area, is suitable for application to spin-electronic devices.
  • Takeshi Kawagoe, Shigemasa Suga
    2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers) 2023年9月  査読有り筆頭著者責任著者
  • Takeshi Kawagoe, Shigemasa Suga
    Japanese Journal of Applied Physics 62(4) 045003/1-7 2023年4月26日  査読有り筆頭著者責任著者
    Abstract We investigated the growth and surface morphology of 10 monolayer (ML)-thick Cr(001) films on clean Au(001) surfaces. High quality epitaxial Cr(001) films with large atomically flat terraces and distinct surface states were successfully fabricated through growth at 300 K and subsequent post-annealing at 520 K. At 300 K, spin-polarized scanning tunneling microscopy images of both the topological and magnetic structures of this Cr film were obtained. The magnetic images exhibited the following features: (1) The layered antiferromagnetic (AF) order appeared in adjacent terraces and one ML-depth shallow hole in the terraces; (2) significant spin frustrations induced by adjacent paired screw dislocations caused the AF domain formation with 90 degrees quantum axis rotation and a large spin frustration area, not always limited in the vicinity of screw dislocations. The feature (2) was qualitatively reproduced by the micromagnetic simulation. These findings may be essential for the further development of spin-electronics utilizing thin AF films.
  • T. Kawagoe, S. Suga
    Journal of Applied Physics 131(4) 045302/1-9 2022年1月31日  査読有り筆頭著者責任著者
  • T. Kawagoe, R. Oka, T. Miyamachi, S. Suga
    Physical Review B 103(8) 085427/1-10 2021年2月18日  査読有り筆頭著者責任著者

主要なMISC

 46

書籍等出版物

 1

共同研究・競争的資金等の研究課題

 11